• University Grad - Process Engineer - Undergrad

    Applied Materials (Santa Clara, CA)
    …Diffraction (XRD), Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), Atomic Force Microscopy (AFM), and spectroscopic methods (eg XPS, ... FTIR), TOF SMIS for analyzing thin films, interfaces, and bulk semiconductor materials + Internship or work experience in the semiconductor fabrication or equipment industry + Semiconductor device physics knowledge **Additional Information** **Time Type:**… more
    Applied Materials (08/27/25)
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