- Applied Materials (Santa Clara, CA)
- …(XRD), Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), Atomic Force Microscopy (AFM), and spectroscopic methods (eg XPS, ... FTIR), TOF SMIS for analyzing thin films, interfaces, and bulk semiconductor materials + Internship or work experience in the semiconductor fabrication or equipment industry + Semiconductor device physics knowledge **Additional Information** **Time Type:**… more