• Tissue Analysis Technician I

    The County of Los Angeles (Los Angeles, CA)
    …submitted fresh to the laboratory for rapid histological diagnosis. + Operates an electron microscope to inspect sections of selected tissue. Prepares black and ... photographic enlargements of surgical specimens from negatives produced by the electron microscope . + Maintains darkroom supplies including preparing… more
    The County of Los Angeles (10/21/25)
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  • Tissue Analysis Technician II

    The County of Los Angeles (Los Angeles, CA)
    …thick plastic sections for study and viewing by a pathologist using a light or electron microscope . + Stains slides with 2-7 micron thick paraffin sections and 1 ... of tissue specimens for morphological analysis under a light and electron microscope in an approved laboratory*. The experience must have included sectioning… more
    The County of Los Angeles (10/18/25)
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  • SEM Technician

    Adecco US, Inc. (Santa Clara, CA)
    …Evaluates performance of process system. . Prepare cross section samples for scanning electron microscope (SEM) analysis and help / guide requestor to optimize ... to perform thin film process, under limited supervision. . Operate scanning electron microscope (SEM) for cross section and top view or critical dimension (CD)… more
    Adecco US, Inc. (01/10/26)
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  • Process Technician III

    Applied Materials (Santa Clara, CA)
    …+ Evaluateperformance of process systems + Prepare cross-section samples for scanning electron microscope (SEM) analysis; optimize sample prep procedure and ... to perform thin film processes, under limited supervision + Operate scanning electron microscope for cross-section and top-view, critical dimension (CD), or… more
    Applied Materials (01/08/26)
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  • Process Tech

    Applied Materials (Santa Clara, CA)
    …Evaluate performance of process systems + Prepare cross-section samples for scanning electron microscope (SEM) analysis; optimize sample prep procedure and ... to perform thin film processes, under limited supervision + Operate scanning electron microscope for cross-section and top-view, critical dimension (CD), or… more
    Applied Materials (01/08/26)
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  • Process Tech

    Applied Materials (Santa Clara, CA)
    …Evaluates performance of process system. - Prepare cross section samples for scanning electron microscope (SEM) analysis and help / guide requestor to optimize ... to perform thin film process, under limited supervision. - Operate scanning electron microscope (SEM) for cross section and top view or critical dimension (CD)… more
    Applied Materials (01/08/26)
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  • Process Technician II (T2)

    Applied Materials (Santa Clara, CA)
    …+ Evaluate performance of process systems + Prepare cross-section samples for scanning electron microscope (SEM) analysis + Operate reactors to perform thin film ... processes, under supervision. + Operate scanning electron microscope for cross-section and top-view, critical dimension (CD), or energy dispersive spectroscopy… more
    Applied Materials (12/19/25)
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  • Focused Ion Beam Technician

    Adecco US, Inc. (Santa Clara, CA)
    …experimentation to evaluate the performance of the process system. . Prepare transmission electron microscope (TEM) lamella samples using focused ion beam (FIB), ... limited supervision after training. . Understand the basic principles of scanning electron microscopy (SEM), focused ion beam (FIB), and transmission electron more
    Adecco US, Inc. (01/06/26)
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  • FIB Technician

    Applied Materials (Santa Clara, CA)
    …experimentation to evaluate the performance of the process system. + Prepare transmission electron microscope (TEM) lamella samples using focused ion beam (FIB), ... operating reactors to perform thin film processes, and using scanning electron microscopes for analyses and imaging. You'll record process conditions and… more
    Applied Materials (11/06/25)
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  • Process Technician Night Shift

    Adecco US, Inc. (Santa Clara, CA)
    …for experimentation, to help evaluates performance of process system . Prepare transmission electron microscope (TEM) lamella samples by focused ion beam (FIB) ... equipment in a lab environment Qualifications: . Understand basic scanning electron microscopy (SEM)/Focused Ion Beam (FIB)/Transmission electron microscopy… more
    Adecco US, Inc. (12/17/25)
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