- Johns Hopkins University (Baltimore, MD)
- …and in situ/operando sample holders o Scanning electron microscopy and focused ion beam o Desire and ability to teach microscopy techniques ... EELS, dual EDS, precession electron diffraction, direct electron detectors, IDES laser and beam manipulation,...imaging (HRTEM and STEM) and 4-D imaging methods o Electron diffraction analysis, including scanning precession … more
- Johns Hopkins University (Gaithersburg, MD)
- …to quantify package and assembly deformation during thermal cycling - Developing FIB /TEM/ SEM analytical methods and X-ray-based techniques for complex advanced ... packaging systems. - Developing robust datasets of materials and interface properties before and after aging for reliability models. - Disseminating research results through presentations at conferences, publication of journal papers, and technical reports. -… more