• Mid-level Semiconductor Materials Engineer

    Battelle Memorial Institute (Columbus, OH)
    …for materials characterization, electrical, and/or structural characterization: focused ion beam ( FIB ), scanning electron microscopy ( SEM ), ... light microscopy. + Intellectual curiosity and a passion for science and technology + Must be a US Citizen and be willing and able to obtain a DoD Top Secret/SCI security clearance **Preferred Qualifications** + Master's degree with (5) or more years… more
    Battelle Memorial Institute (10/07/25)
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  • Cyber Trust & Analytics Intern (Summer 2026)

    Battelle Memorial Institute (Columbus, OH)
    …with operation of laboratory equipment including Focused Ion Beam ( FIB ) systems, Scanning Electron Microscopes ( SEM ), or integrated circuits ... (IC), or sample preparation equipment + Traditional electronics lab equipment supporting component or module test and debug activities + Reverse engineering embedded hardware and software + Programming and using data acquisition tools + Experience with one or… more
    Battelle Memorial Institute (09/24/25)
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