• Metrology Technician III (T3)

    Applied Materials (Santa Clara, CA)
    …based on pattern instructions. + Prepare transmission electron microscope (TEM) lamella samples by focused ion beam (FIB) and help to optimize sample prep ... under limited supervision after training. + Understand basic scanning electron microscopy (SEM)/ Focused Ion Beam (FIB)/Transmission electron microscopy (TEM)… more
    Applied Materials (09/04/25)
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  • FIB Technician - (3rd Shift)

    Applied Materials (Santa Clara, CA)
    …the process system. + Prepare transmission electron microscope (TEM) lamella samples using focused ion beam (FIB), optimize sample preparation procedures and ... training. + Understand the basic principles of scanning electron microscopy (SEM), focused ion beam (FIB), and transmission electron microscopy (TEM). +… more
    Applied Materials (08/07/25)
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  • Electrical Engineer, FPGA and Embedded Software

    General Atomics (San Diego, CA)
    …space systems, advanced sensors, laser communications, target tracking, laser beam control/pointing, signal/image processing, and instrumentation. + With limited ... of professional staff in technical efforts involving Ultra-High Power Lithium- Ion batteries, very compact power converters, adaptive electro-optics, laser control… more
    General Atomics (07/25/25)
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