- Applied Materials (Santa Clara, CA)
- …the process system. + Prepare transmission electron microscope (TEM) lamella samples using focused ion beam (FIB), optimize sample preparation procedures and ... training. + Understand the basic principles of scanning electron microscopy (SEM), focused ion beam (FIB), and transmission electron microscopy (TEM). +… more
- General Atomics (San Diego, CA)
- …space systems, advanced sensors, laser communications, target tracking, laser beam control/pointing, signal/image processing, and instrumentation. + With limited ... of professional staff in technical efforts involving Ultra-High Power Lithium- Ion batteries, very compact power converters, adaptive electro-optics, laser control… more