- Applied Materials (Santa Clara, CA)
- …process system. + Prepare transmission electron microscope ( TEM ) lamella samples using focused ion beam ( FIB ), optimize sample preparation procedures ... Understand the basic principles of scanning electron microscopy (SEM), focused ion beam ( FIB ), and transmission electron microscopy ( TEM ). + Perform… more
- Applied Materials (Santa Clara, CA)
- …use of instrumentation **Qualifications** + Expertise in operation of Dual Beam FIB instruments + Expertise in TEM sample preparation using DB FIB ... and modification of automation recipes (AutoTEM/iFast) + 4+ years experience on FIB /SEM tool + Advanced understanding of semiconductor devices such as FinFET, GAA,… more
- Applied Materials (Santa Clara, CA)
- …based on pattern instructions. + Prepare transmission electron microscope ( TEM ) lamella samples by focused ion beam ( FIB ) and help to optimize sample ... + Understand basic scanning electron microscopy (SEM)/ Focused Ion Beam ( FIB )/Transmission electron microscopy ( TEM ) principle. + Perform SEM/ FIB /… more
- Actalent (Santa Clara, CA)
- …+ Cleanroom protocols + Semiconductor equipment and wafer fabrication + Electron microscopy (SEM, TEM , FIB ) + Metrology and e- beam technologies + Ability to ... tools + Perform advanced wafer analysis using electron microscopy techniques including SEM, TEM , and FIB + Collaborate cross-functionally to design and execute… more