- ThermoFisher Scientific (Johnston, IA)
- …and improve operational quality of system equipment; Transmission Electron Microscopy ( TEM ), Scanning Electron Microscopy (SEM), Small/Large Dual Beam (SDB/LDB); ... Experience: + Operating, troubleshooting, repairing and calibrating complex analysis tools such as SEM, TEM , FIB , Prober or similar systems is a plus but not… more
- Iowa State University (Ames, IA)
- …hands-on experience using aberration-corrected scanning transmission electron microscopy (S/ TEM ), and focused ion beam ( FIB ) techniques. electron ... will be involved in comprehensive dynamic characterization of electron beam -sensitive materials, including the characterization in hydrated state, under controlled… more
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