• Postdoctoral Fellow (PREP0003261) - #Faculty

    Johns Hopkins University (Gaithersburg, MD)
    …through hybrid metrology, open-source, analysis methods, structural maps for wafers with thin films of essential interest to the semiconductor community. Key ... determine structural (physical and chemical) properties of blanket (non-patterned) thin films on Si and SiC wafers....X-ray photoelectron spectroscopy, to determine the structural properties of thin film samples. - Use open-source (python)… more
    Johns Hopkins University (07/24/25)
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  • U109 Solid State Technician - 4th Shift

    Northrop Grumman (Linthicum Heights, MD)
    …and uniformity. + Chemical Vapor Deposition (CVD): Creating high quality, high performance thin films where a volatile precursor gas reacts with the ... to drive species into the substrate or to create thin inter facial layers by introducing a gas or...wafer at a high energy. + Metal Deposition: Metallic films can be deposited onto substrates using a variety… more
    Northrop Grumman (08/21/25)
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  • Associate Metrology & Defects Sustaining Engineer…

    Northrop Grumman (Linthicum Heights, MD)
    …Metrology & Defects Sustaining Engineer (5th Shift) should possess some knowledge of thin film metrology, optical image review techniques and practices. The ... of metrology (such as CD SEMs. litho overlay tools, surface topology profilers, thin film thickness measurement tools) or analytical tools + Ability to work 5th… more
    Northrop Grumman (08/02/25)
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  • Associate Metrology & Defects Sustaining Engineer…

    Northrop Grumman (Linthicum Heights, MD)
    …Metrology & Defects Sustaining Engineer (4th Shift)** should possess some knowledge of thin film metrology, optical image review techniques and practices. The ... of metrology (such as CD SEMs. litho overlay tools, surface topology profilers, thin film thickness measurement tools) or analytical tools + Ability to work 4th… more
    Northrop Grumman (07/02/25)
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  • Metrology & Defects Sustaining Engineer…

    Northrop Grumman (Linthicum Heights, MD)
    …of metrology (such as CD SEMs. litho overlay tools, surface topology profilers, thin film thickness measurement tools) or analytical tools + Knowledge of ... (such as CD SEMs. litho overlay tools, surface topology profilers, thin film thickness measurement tools) or analytical tools + knowledge of statistical… more
    Northrop Grumman (06/27/25)
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  • Lithography Process Engineering Manager 2

    Northrop Grumman (Linthicum Heights, MD)
    …semiconductor lithography including: EBEAM, Optical Lithography (DUV & ILN), contact aligners, thin - film coating tracks (TEL & SVG), CDSEM, and overlay tools ... + Experience with the photo-mask making process. + Experience with workflow modeling, application of Work Breakdown Structure (WBS) practices, and establishment of a metrics-based readiness reporting program. Primary Level Salary Range: $135,800.00 -… more
    Northrop Grumman (08/31/25)
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  • Metrology Characterization Engineer

    Northrop Grumman (Linthicum Heights, MD)
    …is essential. The **Metrology Characterization Engineer** should possess some knowledge of thin film metrology, optical image review techniques and practices. ... The selected candidate should have an aptitude for data analysis, technology development, and demonstrate an ability to communicate well with others and work equally well independently and as part of a team. The **Metrology Characterization Engineer** will be… more
    Northrop Grumman (08/21/25)
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  • Principal / Senior Principal Metrology…

    Northrop Grumman (Linthicum Heights, MD)
    …**Principal/Senior Principal Metrology Characterization Engineer** should possess extensive knowledge of thin film metrology, optical image review techniques and ... practices. The selected candidate should have an aptitude for data analysis, technology development, and demonstrate an ability to communicate well with others and work equally well independently and as part of a team. The **Principal/Senior Principal… more
    Northrop Grumman (08/21/25)
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  • Associate PECVD Sustaining Process Engineer…

    Northrop Grumman (Linthicum Heights, MD)
    …* Experience with TEOS- and silane-based dielectric deposition * Experience with thin film characterization equipment and techniques * Experience with ... PECVD/Diffusion * Demonstrated ability to communicate well with others and work independently * Excellent project management skills with demonstrated ability to identify manufacturing improvements, manage change, and implement solutions. * Experience in… more
    Northrop Grumman (08/15/25)
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  • Postdoctoral Fellow (PREP0003088) - #Faculty

    Johns Hopkins University (Gaithersburg, MD)
    …optimized for used in PICs based on the silicon-in-insulator, silicon nitride, and thin film lithium niobate platforms. Key responsibilities will include but are ... not limited to: + Perform a literature review to assess existing test structure designs and methodologies for PIC parameter extraction + Set up electromagnetic simulation models of existing test structure geometries to enable simulation and optimization for… more
    Johns Hopkins University (07/09/25)
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