- Texas Instruments (Dallas, TX)
- …of SEM and/or Dual-Beam FIB to have x-sectional analysis. + Running Ion Milling Tool to make a large area x-section. + Mechanical polishing/Delayering of wafer or ... Manufacturing/Process. + Electron Microscopy. + Metallurgical sample preparation. **Why TI?** + Engineer your future. We empower our employees to truly own their… more