- Meta (Redmond, WA)
- …characterization of inorganic thin films using techniques like ellipsometry, Scanning Electron Microscopy, Transmission Electron Microscopy, X-ray ... Diffraction and X-ray Photoelectron Spectroscopy 14. 1+ year of experience in materials mechanical characterization and optimization 15. Experience with optical materials structure-property chemistry-process relationships 16. Experience in scientific… more