- ThermoFisher Scientific (West Lafayette, IN)
- …of system equipment; Transmission Electron Microscopy (TEM), Scanning Electron Microscopy ( SEM ), Small/Large Dual Beam (SDB/LDB); instruct customers ... + Overview of our instruments + Inside the Titan Transmission Electron Microscope (https://www.youtube.com/watch?v=2wEmsDh\_l\_A) + How to make a … more
- Applied Materials (Santa Clara, CA)
- …+ Understand the basic principles of scanning electron microscopy ( SEM ), focused ion beam ( FIB ), and transmission electron microscopy ... Prepare transmission electron microscope (TEM) lamella samples using focused ion beam ( FIB ), optimize sample preparation procedures and… more
- Insight Global (Albany, NY)
- …etch, preferably in a high-volume manufacturing facility. - 1 year of experience with SEM tools in a lab environment - Associate's degree or equivalent - Experience ... with troubleshooting and maintaining vacuum-based processing equipment. - Skilled in the use of Microsoft Office applications (Outlook, Word, Excel, and PowerPoint). Must be legally authorized to work in US without sponsorship more
- Applied Materials (Santa Clara, CA)
- …others on advanced use of instrumentation **Qualifications** + Expertise in operation of Dual Beam FIB instruments + Expertise in TEM sample preparation using DB ... of automation recipes (AutoTEM/iFast) + 4+ years experience on FIB / SEM tool + Advanced understanding of semiconductor...Experience with Atom Probe Tomography + Experience with Plasma FIB systems + Familiarity with Electron Microscopic… more
- Applied Materials (Santa Clara, CA)
- …after training. + Understand basic scanning electron microscopy ( SEM )/ Focused Ion Beam ( FIB )/Transmission electron microscopy (TEM) ... of process system + Prepare cross section samples for scanning electron microscope ( SEM...electron microscope (TEM) lamella samples by focused ion beam ( FIB… more
- University of Rochester (Rochester, NY)
- …of samples using equipment such as a Scanning Electron Microscope ( SEM ), Focused Ion Beam ( FIB ), Transmission Electron Microscope ... initial employment, more time will be devoted to sample preparation. 70% SEM /TEM/ FIB /SQUID analysis: The Scientist will be required to exercise independent… more
- Micron Technology, Inc. (Boise, ID)
- …skills + Experience running Scanning Electron Microscope and/or Focused Ion Beam tools is a plus **Education Requirements:** + Pursuing ... a Bachelor's degree or Master's degree in Electrical Engineering, Chemical Engineering, Materials Science & Engineering, or related field. **About Micron Technology, Inc.** We are an industry leader in innovative memory and storage solutions. Through our… more
- Battelle Memorial Institute (Columbus, OH)
- …for materials characterization, electrical, and/or structural characterization: focused ion beam ( FIB ), scanning electron microscopy ( SEM ), ... light microscopy. + Intellectual curiosity and a passion for science and technology + Must be a US Citizen and be willing and able to obtain a DoD Top Secret/SCI security clearance **Preferred Qualifications** + Master's degree with (2) or more years… more
- University of Rochester (Rochester, NY)
- …scanning electron microscopes ( SEM ), electron spectroscopy (ie EDS), focused ion beam ( FIB ) preparation of samples, transmission ... electron microscopy (TEM), physical vapor deposition tools, reactive ion (plasma) processing, wafer scale silicon and associated oxide processing, soft/hard… more
- Johns Hopkins University (Baltimore, MD)
- …and in situ/operando sample holders o Scanning electron microscopy and focused ion beam o Desire and ability to teach microscopy techniques ... EELS, dual EDS, precession electron diffraction, direct electron detectors, IDES laser and beam manipulation,...imaging (HRTEM and STEM) and 4-D imaging methods o Electron diffraction analysis, including scanning precession … more