• Postdoctoral Appointee - Electron Microscopy…

    Argonne National Laboratory (Lemont, IL)
    …Division seeks a postdoctoral scientist to advance transmission electron microscopy ( TEM ) studies of materials and interfaces relevant to microelectronics. Working ... the successful candidate will leverage state-of-the-art functional and dynamic TEM capabilities to lead experimental research on defect species, distributions,… more
    Argonne National Laboratory (10/10/25)
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  • Failure Analysis Technician

    NY CREATES (Albany, NY)
    …semiconductor structures and devices using advanced instrumentation such as SEM, FIB, and TEM . The successful candidate will play a key role in identifying defects, ... Microscopes (SEM), Focused Ion Beam (FIB) systems, Transmission Electron Microscopes ( TEM ), and other laboratory equipment. + Perform physical and electrical failure… more
    NY CREATES (11/25/25)
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  • Director, Enterprise Network Services

    ITT (NY)
    …Experience managing project budgets, forecasts, and financial models, including cost optimization and Telecom Expense Management ( TEM ). + Demonstrated ... business stakeholders to ensure seamless alignment between infrastructure, cyber risk management , and business requirements. + Lead regular periodic sessions with IT… more
    ITT (12/02/25)
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  • Manager, Tech Service Delivery - Field Network

    The Hertz Corporation (Atlanta, GA)
    …tracking and digital workflow tools; agile methodology experience is a plus. + Familiarity with Telecom Expense Management ( TEM ) tools. + Strong data ... progress and deliverables. + Enforce ITSM processes for Change, Incident, and Problem Management . + Utilize dashboards and reports to track SLA and KPI compliance… more
    The Hertz Corporation (11/13/25)
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  • Process Technician Night Shift

    Adecco US, Inc. (Santa Clara, CA)
    …to help evaluates performance of process system . Prepare transmission electron microscope ( TEM ) lamella samples by focused ion beam (FIB) and help to optimize ... cutting location based on pattern instructions. . Operate metrology tools in FIB & TEM lab to help understand cross section or top view critical dimension (CD),… more
    Adecco US, Inc. (12/17/25)
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  • Process Technician

    Adecco US, Inc. (Santa Clara, CA)
    …the performance of the process system. . Prepare transmission electron microscope ( TEM ) lamella samples using focused ion beam (FIB), optimize sample preparation ... based on pattern instructions. . Operate metrology tools in the FIB & TEM lab to understand cross-section or top-view critical dimensions (CD), identify patterns of… more
    Adecco US, Inc. (11/27/25)
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  • FIB Technician

    Applied Materials (Hillsboro, OR)
    …the performance of the process system. + Prepare transmission electron microscope ( TEM ) lamella samples using focused ion beam (FIB), optimize sample preparation ... based on pattern instructions. + Operate metrology tools in the FIB & TEM lab to understand cross-section or top-view critical dimensions (CD), identify patterns of… more
    Applied Materials (11/07/25)
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  • Cryo-FIB Application Scientist

    ThermoFisher Scientific (Lebanon, TN)
    …of performing cryo-Electron Tomography on our Krios cryo-Transmission Electron Microscope ( TEM ) instruments. Additionally, you will develop methods and workflows for ... electron microscopy, ideally with a familiarity in both cryo-FIB milling and TEM sample preparation. Strong technical understanding of FIB theory and technology as… more
    ThermoFisher Scientific (10/12/25)
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  • Associate Director for Microscopy - #Faculty

    Johns Hopkins University (Baltimore, MD)
    …on integration of AI/ML with cutting edge stimulus, controls and automation platforms in TEM and SEM. The position will report to the Executive Director of the MCP ... interdisciplinary technical goals Specific Duties & Responsibilities - Be the main TEM microscopist responsible for maintaining, operating and training of the JEOL… more
    Johns Hopkins University (12/26/25)
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  • Hardware Developer

    IBM (Albany, NY)
    …Design of Experiments (DOE) and Root Cause Analysis (RCA), CD SEM and TEM Data Analysis, Statistical Process Control (SPC), Fault Detection and Classification (FDC). ... (DOE) and Root Cause Analysis (RCA), CD SEM and TEM Data Analysis, Statistical Process Control (SPC), Fault Detection...(DOE) and Root Cause Analysis (RCA), CD SEM and TEM Data Analysis, Statistical Process Control (SPC), Fault Detection… more
    IBM (12/24/25)
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