• Postdoctoral Fellow (PREP0003537) - #Faculty

    Johns Hopkins University (Gaithersburg, MD)
    …to quantify package and assembly deformation during thermal cycling - Developing FIB / TEM /SEM analytical methods and X-ray-based techniques for complex advanced ... packaging systems. - Developing robust datasets of materials and interface properties before and after aging for reliability models. - Disseminating research results through presentations at conferences, publication of journal papers, and technical reports. -… more
    Johns Hopkins University (09/23/25)
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  • Metrology Technician

    NY CREATES (Albany, NY)
    …stability, and sources of anomalies. + Offline measurement techniques may include SEM, TEM prep and FIB . + The candidate must execute project-based tasks ... that include defect metrology and characterization of materials and films, working side-by-side with a diverse group of engineers. + Assume ownership and accountability for successful completion of projects and programs. + Report results; interacting with… more
    NY CREATES (09/20/25)
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  • Research Associate-Fixed Term

    Michigan State University (East Lansing, MI)
    …cementitious material design and characterization + Multifunctional fiber -reinforced cementitious/ceramic composites + Low-carbon infrastructure materials + ... + Strong analytical skills are beneficial, including but not limited to SEM, TEM , XRD, TGA, FITR, NMR, and ICP-OES. Experience with thermodynamic modeling of… more
    Michigan State University (09/16/25)
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