- Applied Materials (Albany, NY)
- …of the process system. + Prepare transmission electron microscope (TEM) lamella samples using focused ion beam ( FIB ), optimize sample preparation ... training. + Understand the basic principles of scanning electron microscopy (SEM), focused ion beam ( FIB ), and transmission electron microscopy (TEM).… more
- Applied Materials (Santa Clara, CA)
- …of the process system. + Prepare transmission electron microscope (TEM) lamella samples using focused ion beam ( FIB ), optimize sample preparation ... training. + Understand the basic principles of scanning electron microscopy (SEM), focused ion beam ( FIB ), and transmission electron microscopy (TEM).… more
- ThermoFisher Scientific (Albuquerque, NM)
- …nano-, and picometer scales. Combining hardware and software expertise in electron, ion , and light microscopy technologies with deep application knowledge in the ... Operating, troubleshooting, repairing and calibrating complex analysis tools such as SEM, TEM, FIB , Prober or similar systems is a plus but not required. +… more
- ThermoFisher Scientific (Indianapolis, IN)
- …nano-, and picometer scales. Combining hardware and software expertise in electron, ion , and light microscopy technologies with deep application knowledge in the ... Transmission Electron Microscopy (TEM), Scanning Electron Microscopy (SEM), Small/Large Dual Beam (SDB/LDB); instruct customers in the operation and maintenance of… more
- ThermoFisher Scientific (Hillsboro, OR)
- …nano-, and picometer scales. Combining hardware and software expertise in electron, ion , and light microscopy technologies with deep application knowledge in the ... Transmission Electron Microscopy (TEM), Scanning Electron Microscopy (SEM), Small/Large Dual Beam (SDB/LDB); instruct customers in the operation and maintenance of… more
- Applied Materials (Santa Clara, CA)
- …all of patterns of interest, understand image quality requirement and sample/ beam interaction to determine optimized condition. Records process conditions and ... experimental observations. - Understand basic scanning electron microscope (SEM) principle. Responsible for multiple technology products. - Perform scanning electron microscope (SEM) system software alignment functions. Perform routine maintenance procedures,… more
- Adecco US, Inc. (Santa Clara, CA)
- …of the process system. . Prepare transmission electron microscope (TEM) lamella samples using focused ion beam ( FIB ), optimize sample preparation ... training. . Understand the basic principles of scanning electron microscopy (SEM), focused ion beam ( FIB ), and transmission electron microscopy (TEM).… more
- ThermoFisher Scientific (Hillsboro, OR)
- …of hands-on experience with Dual Beam , focused ion beam scanning and electron microscopy ( FIB /SEM), or Transmission Electron Microscopy (TEM). + ... background working with Transmission Electron Microscopes, Scanning Electron Microscopes, and/or Dual Beam / Focused Ion Beam Technology and are familiar… more
- Applied Materials (Albany, NY)
- …after training. + Understand the basic principles of scanning electron microscopy (SEM), focused ion beam ( FIB ), transmission electron microscopy ... documentation. + Train and provide guidelines of sample preparation techniques to FIB technicians for successful TEM analysis. + Develop TEM imaging/data analysis… more
- University of Rochester (Rochester, NY)
- …magnetic analyses of samples using equipment such as a Scanning Electron Microscope (SEM), Focused Ion Beam ( FIB ), Transmission Electron Microscope ... more time will be devoted to sample preparation. 70% SEM/TEM/ FIB /SQUID analysis: The Scientist will be required to exercise...laboratory instrument including but not limited to SEM, TEM, FIB and SQUID magnetometer instruments at the UR and… more