• Material Characterization Specialist

    Panasonic North America (Sparks, NV)
    …properties using instrumentation including tensile testers, scanning electron microscope (SEM), focused ion beam (FIB), energy-dispersive X-ray spectroscopy ... seeking ambitious engineers and scientists to lead the world's largest lithium ion battery initiative. With superior battery designs and the fastest manufacturing… more
    Panasonic North America (05/06/25)
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  • Lab Technician

    Adecco US, Inc. (Santa Clara, CA)
    …the process system. . Prepare transmission electron microscope (TEM) lamella samples using focused ion beam (FIB), optimize sample preparation procedures and ... training. . Understand the basic principles of scanning electron microscopy (SEM), focused ion beam (FIB), and transmission electron microscopy (TEM). .… more
    Adecco US, Inc. (07/10/25)
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  • FIB Technician

    Applied Materials (Santa Clara, CA)
    …the process system. + Prepare transmission electron microscope (TEM) lamella samples using focused ion beam (FIB), optimize sample preparation procedures and ... training. + Understand the basic principles of scanning electron microscopy (SEM), focused ion beam (FIB), and transmission electron microscopy (TEM). +… more
    Applied Materials (06/05/25)
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  • FIB Technician IV

    Applied Materials (Albany, NY)
    …the process system. + Prepare transmission electron microscope (TEM) lamella samples using focused ion beam (FIB), optimize sample preparation procedures and ... training. + Understand the basic principles of scanning electron microscopy (SEM), focused ion beam (FIB), and transmission electron microscopy (TEM). +… more
    Applied Materials (05/28/25)
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  • Field Applications Engineer (Semiconductor)

    ThermoFisher Scientific (Hillsboro, OR)
    …an advanced degree is preferred. + Minimum 3+ years of hands-on experience with Dual Beam , focused ion beam scanning and electron microscopy (FIB/SEM), ... and picometer scales. Combining hardware and software expertise in electron, ion , and light microscopy with deep application knowledge in semiconductor technology,… more
    ThermoFisher Scientific (07/11/25)
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  • Field Applications Engineer (Semiconductor)

    ThermoFisher Scientific (Boise, ID)
    …an advanced degree is preferred. + Minimum of 3+ years of hands-on experience with Dual Beam , focused ion beam scanning and electron microscopy (FIB/SEM) ... and picometer scales. Combining hardware and software expertise in electron, ion , and light microscopy with deep application knowledge in semiconductor technology,… more
    ThermoFisher Scientific (06/22/25)
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  • Associate Director for Microscopy - #Faculty

    Johns Hopkins University (Baltimore, MD)
    …of: o Electron tomography and in situ/operando sample holders o Scanning electron microscopy and focused ion beam o Desire and ability to teach microscopy ... Intelligent Microscopy -- a Center of Excellence in partnership with JEOL Ltd. focused on integration of AI/ML with cutting edge stimulus, controls and automation… more
    Johns Hopkins University (06/28/25)
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  • Application Scientist

    ThermoFisher Scientific (Hillsboro, OR)
    …a background working with Transmission Electron Microscopes, Scanning Electron Microscopes, or Dual Beam / Focused Ion Beam Technology and are familiar ... in one of those scientific areas - we are looking for you: + Life Sciences (Cell and Structural Biology) + Material Science (Metals, Alloys, Composites, Ceramics) + Semiconductor (Metrology and Failure Analysis) **How will you make an impact in our team?**… more
    ThermoFisher Scientific (07/11/25)
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  • TEM Engineer IV

    Applied Materials (Albany, NY)
    …after training. + Understand the basic principles of scanning electron microscopy (SEM), focused ion beam (FIB), transmission electron microscopy (TEM) and ... identify patterns of interest, understand image quality requirements and sample/ beam interactions to determine optimized conditions, and complete requested jobs… more
    Applied Materials (05/28/25)
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  • Technical Manager URNANO

    University of Rochester (Rochester, NY)
    …knowledge of state-of-the-art scanning electron microscopes (SEM), electron spectroscopy (ie EDS), focused ion beam (FIB) preparation of samples, ... transmission electron microscopy (TEM), physical vapor deposition tools, reactive ion (plasma) processing, wafer scale silicon and associated oxide processing,… more
    University of Rochester (06/16/25)
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