• Argonne National Laboratory (Lemont, IL)
    …defect characterization + Implement high-throughput and automated TEM specimen preparation, including focused ion beam (FIB) methods + Curate and ... atomic-resolution imaging, EELS, and EDS; experience with cathodoluminescence (CL) and electron- beam induced current (EBIC) imaging is a plus + Experience with… more
    DirectEmployers Association (10/10/25)
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  • NY CREATES (Albany, NY)
    …Operate and maintain advanced analytical tools, including Scanning Electron Microscopes (SEM), Focused Ion Beam (FIB) systems, Transmission Electron ... in semiconductor failure analysis or analytical lab settings. Proficiency with Dual- Beam FIB systems, high-resolution SEM, and advanced TEM tools. Prior experience… more
    job goal (12/11/25)
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  • Micron Technology, Inc. (Boise, ID)
    …+ Develop expert level sample preparation skills + Develop expert level microscopy skills ( Focused Ion Beam (FIB), Scanning Electron Microscope (SEM), CSAM, ... X-RAY) + Work shift is TBD - Shift and Hours flexibility (position requires day to night shift rotations in intervals of 4 months) **Education & Experience:** + 5+ years to applicable experience, or applicable Engineering BS **Desired Behaviors:** +… more
    DirectEmployers Association (11/19/25)
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  • Senior/Principal Physics- Ion Beam

    Sandia National Laboratories (Albuquerque, NM)
    …seeking a senior physicist scientist with a strong interest and expertise in focused ion beam implantation/irradiation and optical testing using ... testing of cutting-edge materials and devices. The role will utilize a range of focused ion beam implantation capabilities including both 100 kV and 35 kV… more
    Sandia National Laboratories (11/25/25)
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  • Senior/Principal Physics- Ion Beam

    Sandia National Laboratories (Albuquerque, NM)
    …30 kV Helium Ion Microscopes, and both 35 kV and 100 kV mass velocity filtered focused ion beam systems, achieving spot sizes of less than 10 nm on ... national security and technology innovation, with teams of specialists focused on cutting-edge work in a broad array of...Interactions Department at Sandia National Laboratories, which operates the Ion Beam Laboratory (IBL), is seeking a… more
    Sandia National Laboratories (11/25/25)
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  • FIB Technician

    Adecco US, Inc. (Santa Clara, CA)
    Adecco is hiring immediately for an Focused Ion Beam Technician with a local client in Santa Clara, CA. Pay is $33.00/hr - $35.00/hr. Duties: . Shift: ... system. . Prepare transmission electron microscope (TEM) lamella samples using focused ion beam (FIB), optimize sample preparation procedures and conditions,… more
    Adecco US, Inc. (11/07/25)
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  • Field Applications Engineer (Semiconductor)

    ThermoFisher Scientific (Hillsboro, OR)
    …a background working with Transmission Electron Microscopes, Scanning Electron Microscopes, and/or Dual Beam / Focused Ion Beam Technology and are familiar ... advanced degree is preferred. + Minimum 3+ years of hands-on experience with Dual Beam , focused ion beam scanning and electron microscopy (FIB/SEM), or… more
    ThermoFisher Scientific (11/20/25)
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  • FIB Technician

    Applied Materials (Hillsboro, OR)
    …the process system. + Prepare transmission electron microscope (TEM) lamella samples using focused ion beam (FIB), optimize sample preparation procedures and ... training. + Understand the basic principles of scanning electron microscopy (SEM), focused ion beam (FIB), and transmission electron microscopy (TEM). +… more
    Applied Materials (11/07/25)
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  • Associate Director for Microscopy - #Faculty

    Johns Hopkins University (Baltimore, MD)
    …of: o Electron tomography and in situ/operando sample holders o Scanning electron microscopy and focused ion beam o Desire and ability to teach microscopy ... Intelligent Microscopy -- a Center of Excellence in partnership with JEOL Ltd. focused on integration of AI/ML with cutting edge stimulus, controls and automation… more
    Johns Hopkins University (09/26/25)
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  • Technical Manager URNANO

    University of Rochester (Rochester, NY)
    …knowledge of state-of-the-art scanning electron microscopes (SEM), electron spectroscopy (ie EDS), focused ion beam (FIB) preparation of samples, ... transmission electron microscopy (TEM), physical vapor deposition tools, reactive ion (plasma) processing, wafer scale silicon and associated oxide processing,… more
    University of Rochester (11/06/25)
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