• Senior/Principal Physics - Ion Beam

    Sandia National Laboratories (Albuquerque, NM)
    …and characterization of materials and devices. The research will involve using a range of focused ion beam implantation capabilities from focused ion ... Ion Microscopes and both a 35kV and 100 kV mass velocity filtered focused ion beam systems with <10nm spot size on target. Other experimental facilities… more
    Sandia National Laboratories (05/03/25)
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  • Intern, R&D Graduate Year-Round - Radiation-Solid…

    Sandia National Laboratories (Albuquerque, NM)
    …and photoluminescence. + Work on advanced fabrication projects utilizing state-of-the-art focused ion beam technologies in best-in-class labs. ... Ion Microscopes and both a 35kV and 100 kV mass velocity filtered focused ion beam systems with <10nm spot size on target. Other experimental facilities… more
    Sandia National Laboratories (04/29/25)
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  • Material Characterization Specialist

    Panasonic North America (Sparks, NV)
    …properties using instrumentation including tensile testers, scanning electron microscope (SEM), focused ion beam (FIB), energy-dispersive X-ray spectroscopy ... seeking ambitious engineers and scientists to lead the world's largest lithium ion battery initiative. With superior battery designs and the fastest manufacturing… more
    Panasonic North America (05/06/25)
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  • FIB Technician - (3rd Shift)

    Applied Materials (Santa Clara, CA)
    …the process system. + Prepare transmission electron microscope (TEM) lamella samples using focused ion beam (FIB), optimize sample preparation procedures and ... training. + Understand the basic principles of scanning electron microscopy (SEM), focused ion beam (FIB), and transmission electron microscopy (TEM). +… more
    Applied Materials (04/03/25)
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  • Postdoctoral Fellow (Prep0003252)

    Johns Hopkins University (Gaithersburg, MD)
    …The candidate is expected to prepare sample cross sections using mechanical polishing or focused ion beam for optical and scanning electron microscopy ... analysis. | Experience with scanning electron microscopy measurements. | Experience with focused ion beam -based characterization | Experience with… more
    Johns Hopkins University (04/24/25)
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  • Assistant Academic Research Scientist - School…

    Emory Healthcare/Emory University (Atlanta, GA)
    …job classification. PREFERRED QUALIFICATIONS: + PhD in structural biology with experience in Focused Ion Beam - Scanning Electron Microscopy techniques ... cryo and room temperature applications. + Master's degree with demonstrated Focused Ion Beam - Scanning Electron Microscopy experience in… more
    Emory Healthcare/Emory University (04/12/25)
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  • Field Applications Engineer (Semiconductor)

    ThermoFisher Scientific (Hillsboro, OR)
    …an advanced degree is preferred. + Minimum 3+ years of hands-on experience with Dual Beam , focused ion beam scanning and electron microscopy (FIB/SEM), ... and picometer scales. Combining hardware and software expertise in electron, ion , and light microscopy with deep application knowledge in semiconductor technology,… more
    ThermoFisher Scientific (04/11/25)
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  • Postdoctoral Research Associate - Ames National…

    Iowa State University (Ames, IA)
    …with hands-on experience using aberration-corrected scanning transmission electron microscopy (S/TEM), and focused ion beam (FIB) techniques. electron energy ... will be involved in comprehensive dynamic characterization of electron beam -sensitive materials, including the characterization in hydrated state, under controlled… more
    Iowa State University (04/17/25)
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  • Technical Manager URNANO

    University of Rochester (Rochester, NY)
    …knowledge of state-of-the-art scanning electron microscopes (SEM), electron spectroscopy (ie EDS), focused ion beam (FIB) preparation of samples, ... transmission electron microscopy (TEM), physical vapor deposition tools, reactive ion (plasma) processing, wafer scale silicon and associated oxide processing,… more
    University of Rochester (03/17/25)
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  • TEM Technician III - (T3)

    Applied Materials (Santa Clara, CA)
    …and team members to optimize experiments and explain results. **Qualifications:** Experience on Focused Ion Beam (FIB) for TEM sample preparation. 2+ ... all of patterns of interest, understand image quality requirement and sample/ beam interaction to determine optimized condition. Prepares graphs and tables… more
    Applied Materials (05/01/25)
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