• Engineer II, Field Service (SEM, Tem

    ThermoFisher Scientific (Albuquerque, NM)
    …Experience: + Operating, troubleshooting, repairing and calibrating complex analysis tools such as SEM, TEM , FIB , Prober or similar systems is a plus but not ... nano-, and picometer scales. Combining hardware and software expertise in electron, ion , and light microscopy technologies with deep application knowledge in the… more
    ThermoFisher Scientific (07/04/25)
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  • Field Service Engineer II (SEM, Tem

    ThermoFisher Scientific (Hillsboro, OR)
    …and improve operational quality of system equipment; Transmission Electron Microscopy ( TEM ), Scanning Electron Microscopy (SEM), Small/Large Dual Beam (SDB/LDB); ... Experience: + Operating, troubleshooting, repairing and calibrating complex analysis tools such as SEM, TEM , FIB , Prober or similar systems is a plus but not… more
    ThermoFisher Scientific (06/06/25)
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  • FIB Technician V

    Applied Materials (Albany, NY)
    …process system. + Prepare transmission electron microscope ( TEM ) lamella samples using focused ion beam ( FIB ), optimize sample preparation procedures ... Understand the basic principles of scanning electron microscopy (SEM), focused ion beam ( FIB ), and transmission electron microscopy ( TEM ). + Perform… more
    Applied Materials (05/28/25)
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  • FIB Technician

    Applied Materials (Santa Clara, CA)
    …process system. + Prepare transmission electron microscope ( TEM ) lamella samples using focused ion beam ( FIB ), optimize sample preparation procedures ... Understand the basic principles of scanning electron microscopy (SEM), focused ion beam ( FIB ), and transmission electron microscopy ( TEM ). + Perform… more
    Applied Materials (06/05/25)
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  • TEM Engineer V

    Applied Materials (Albany, NY)
    …basic principles of scanning electron microscopy (SEM), focused ion beam ( FIB ), transmission electron microscopy ( TEM ) and Materials analysis (EDX, ... procedures and documentation. + Train and provide guidelines of sample preparation techniques to FIB technicians for successful TEM analysis. + Develop TEM more
    Applied Materials (05/28/25)
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  • Transmission Electron Microscopy ( TEM

    Western Digital (San Jose, CA)
    …disk drives, is seeking a data scientist with advanced Transmission Electron Microscopy ( TEM ) expertise to join a growing team of electron microscopists who support ... automating high-end TEMs. The candidate will develop efficient data management and infrastructure tools to improve turnaround time. The...Physics, or other related engineering discipline with focus on TEM research is required. 2. 3 or more years… more
    Western Digital (07/12/25)
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  • Lab Technician

    Adecco US, Inc. (Santa Clara, CA)
    …process system. . Prepare transmission electron microscope ( TEM ) lamella samples using focused ion beam ( FIB ), optimize sample preparation procedures ... Understand the basic principles of scanning electron microscopy (SEM), focused ion beam ( FIB ), and transmission electron microscopy ( TEM ). . Perform… more
    Adecco US, Inc. (07/10/25)
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  • Paleomagnetic Research Lab Scientist

    University of Rochester (Rochester, NY)
    …equipment such as a Scanning Electron Microscope (SEM), Focused Ion Beam ( FIB ), Transmission Electron Microscope ( TEM ), and other analysis equipment ... employment, more time will be devoted to sample preparation. 70% SEM/ TEM / FIB /SQUID analysis: The Scientist will be required to exercise independent technical… more
    University of Rochester (05/12/25)
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  • Field Applications Engineer (Semiconductor)

    ThermoFisher Scientific (Hillsboro, OR)
    …of hands-on experience with Dual Beam , focused ion beam scanning and electron microscopy ( FIB /SEM), or Transmission Electron Microscopy ( TEM ). ... background working with Transmission Electron Microscopes, Scanning Electron Microscopes, and/or Dual Beam / Focused Ion Beam Technology and are familiar… more
    ThermoFisher Scientific (07/11/25)
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  • Intern/Surface Scientist

    Micron Technology, Inc. (Boise, ID)
    …+ Electrical Characterization Techniques + Atom Probe Tomography (APT) + Dual Beam Focused Ion Beam ( FIB ) + Scanning Electron Microscopy (SEM) ... + Transmission Electron Microscopy ( TEM ) Excellent technical, communication, and analytical skills **Responsibilities:** Partner with Surface Scientists to evaluate… more
    Micron Technology, Inc. (08/01/25)
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