- Applied Materials (Albany, NY)
- …of the process system. + Prepare transmission electron microscope (TEM) lamella samples using focused ion beam ( FIB ), optimize sample preparation ... training. + Understand the basic principles of scanning electron microscopy (SEM), focused ion beam ( FIB ), and transmission electron microscopy (TEM).… more
- Electronic Environments (New York, NY)
- ELECTRONIC ENVIRONMENTS has been an A/ V industry pioneer and leader for over 35 years. We enjoy making technology fun and convenient for our clients. Electronic ... access controls and IT infrastructure. We are currently looking for an experienced Lead Technician in our NYC office. Our ideal candidate should possess 5+ years of… more