- NY CREATES (Albany, NY)
- …Category: Engineering Posted On: Thu Jan 30 2025 Job Description: Job Description for Metrology Services FIB / TEM /Technician JOB SUMMARY NY-CREATES is ... if needed + Other reasonable duties as assigned. Job Requirements: Minimum Requirements for Metrology Services FIB / TEM /Technician + An associate's degree… more
- Applied Materials (Santa Clara, CA)
- …process system. + Prepare transmission electron microscope ( TEM ) lamella samples using focused ion beam ( FIB ), optimize sample preparation procedures ... instructions. + Operate metrology tools in the FIB & TEM lab to understand cross-section... focused ion beam ( FIB ), and transmission electron microscopy ( TEM ). +… more
- ThermoFisher Scientific (Hillsboro, OR)
- …of hands-on experience with Dual Beam , focused ion beam scanning and electron microscopy ( FIB /SEM), or Transmission Electron Microscopy ( TEM ). ... and picometer scales. Combining hardware and software expertise in electron, ion , and light microscopy with deep application knowledge in semiconductor technology,… more
- WGNSTAR (Hillsboro, OR)
- …process equipment. + Operate Dual Beam (SEM and FIB ), TEM , light microscopes, deposition equipment, and metrology tools. + Change/adjust software ... dynamic and growing company with a global footprint. Primarily focused on the semiconductor industry, we provide a platform...records, charts, and graphs of test results. + Operate metrology tools (including TEM , Dual Beam… more
- Applied Materials (Santa Clara, CA)
- …to communicate BU engagement progress, scorecard, track progress and pull resources from TEM /SEM/ FIB and metrology to solve business HVP. Uses sound ... new chip and advanced display in the world. We design, build and service cutting-edge equipment that helps our customers manufacture display and semiconductor chips… more
- ThermoFisher Scientific (Fremont, CA)
- …education and experience: + Minimum of 8+ years of hands-on experience with dual beam ( FIB /SEM) conducting lamella ( TEM sample) preparation and other ... Unit provides solutions in pathfinding, yield learning, critical dimension (CD) metrology and failure analysis (FA) of semiconductor processes and manufacturing. Our… more