- Johns Hopkins University (Gaithersburg, MD)
- …will include but are not limited to: - Plan and conduct research on advanced X-ray metrologies to determine structural (physical and chemical) properties of blanket ... (non-patterned) thin films on Si and SiC wafers. - Use X-ray characterization methods, such as X-ray reflectivity, X-ray fluorescence, X-ray photoelectron spectroscopy, to determine the structural properties of thin film samples. - Use open-source (python)… more