- Insight Global (Albany, NY)
- …etch, preferably in a high-volume manufacturing facility. - 1 year of experience with SEM tools in a lab environment - Associate's degree or equivalent - Experience ... with troubleshooting and maintaining vacuum-based processing equipment. - Skilled in the use of Microsoft Office applications (Outlook, Word, Excel, and PowerPoint). Must be legally authorized to work in US without sponsorship more
- University of Rochester (Rochester, NY)
- …scanning electron microscopes ( SEM ), electron spectroscopy (ie EDS), focused ion beam ( FIB ) preparation of samples, transmission ... electron microscopy (TEM), physical vapor deposition tools, reactive ion (plasma) processing, wafer scale silicon and associated oxide processing, soft/hard… more
- NY CREATES (Albany, NY)
- …Job responsibilities include, but are not limited to: + Effective day-to-day operation of SEM , FIB and TEM instruments for analytical work + Perform SEM ... analysis on samples submitted by requesting partners and on-site customers + Perform FIB - SEM and FIB prep of TEM samples from requesting customer base +… more
- WGNSTAR (Albany, NY)
- …but not limited for dilute Hydrofluoric Acid + Imaging sample features utilizing Scanning Electron Microscopy ( SEM ] + Collecting compositional feature data ... in Physical Science or equivalent experience is required + Previous hands-on experience with FIB and/or SEM /TEM + Previous hands-on experience with X- SEM … more
- Global Foundries (Malta, NY)
- …+ Strong planning & organizational skills + Semiconductor process knowledge + Experience using SEM , FIB , TEM sample preparation, TEM imaging, SIMS. + Able to ... follow detailed instructions and procedures to complete tasks and required documentation; demonstrate solid work performance in an environment requiring high level of attention to detail and timeliness + Strong team member, able to work well with a global… more
- NY CREATES (Albany, NY)
- …performance, stability, and sources of anomalies. + Offline measurement techniques may include SEM , TEM prep and FIB . + The candidate must execute project-based ... of advanced structures through means such as optical metrology, X-Ray metrology, electron microscopy, and/or hybrid metrologies and analysis of measurement… more
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