- Applied Materials (Albany, NY)
- …+ Understand the basic principles of scanning electron microscopy ( SEM ), focused ion beam ( FIB ), and transmission electron microscopy ... Prepare transmission electron microscope (TEM) lamella samples using focused ion beam ( FIB ), optimize sample preparation procedures and… more
- University of Rochester (Rochester, NY)
- …of samples using equipment such as a Scanning Electron Microscope ( SEM ), Focused Ion Beam ( FIB ), Transmission Electron Microscope ... initial employment, more time will be devoted to sample preparation. 70% SEM /TEM/ FIB /SQUID analysis: The Scientist will be required to exercise independent… more
- Applied Materials (Albany, NY)
- …+ Understand the basic principles of scanning electron microscopy ( SEM ), focused ion beam ( FIB ), transmission electron microscopy (TEM) ... documentation. + Train and provide guidelines of sample preparation techniques to FIB technicians for successful TEM analysis. + Develop TEM imaging/data analysis… more
- University of Rochester (Rochester, NY)
- …scanning electron microscopes ( SEM ), electron spectroscopy (ie EDS), focused ion beam ( FIB ) preparation of samples, transmission ... electron microscopy (TEM), physical vapor deposition tools, reactive ion (plasma) processing, wafer scale silicon and associated oxide processing, soft/hard… more
- Rochester Institute of Technology (Rochester, NY)
- …to develop sustainable material prototypes. + Apply analytical methods such as SEM , DSC, FTIR, and WVTR/O₂TR testing to characterize material structure, barrier ... Science, or a related field. + Hands-on experience with polymer and fiber -based packaging materials, including paper and flexible packaging systems. + Experience… more