- Battelle Memorial Institute (Columbus, OH)
- …techniques for materials characterization, electrical, and/or structural characterization: focused ion beam (FIB), scanning electron microscopy (SEM), light ... microscopy. + Intellectual curiosity and a passion for science and technology + Must be a US Citizen and be willing and able to obtain a DoD Top Secret/SCI security clearance **Preferred Qualifications** + Master's degree with (5) or more years equivalent work… more
- Battelle Memorial Institute (Columbus, OH)
- …CTFs, etc.) + Familiarity with operation of laboratory equipment including Focused Ion Beam (FIB) systems, Scanning Electron Microscopes (SEM), or integrated ... circuits (IC), or sample preparation equipment + Traditional electronics lab equipment supporting component or module test and debug activities + Reverse engineering embedded hardware and software + Programming and using data acquisition tools + Experience… more
