• Mid-level Semiconductor Materials Engineer

    Battelle Memorial Institute (Columbus, OH)
    …techniques for materials characterization, electrical, and/or structural characterization: focused ion beam (FIB), scanning electron microscopy (SEM), light ... microscopy. + Intellectual curiosity and a passion for science and technology + Must be a US Citizen + Holds an DOD Active Secret; willing and able to obtain a DoD Top Secret/SCI security clearance **Preferred Qualifications** + Master's degree or 0-6 years'… more
    Battelle Memorial Institute (10/31/25)
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  • Cyber Trust & Analytics Intern (Summer 2026)

    Battelle Memorial Institute (Columbus, OH)
    …CTFs, etc.) + Familiarity with operation of laboratory equipment including Focused Ion Beam (FIB) systems, Scanning Electron Microscopes (SEM), or integrated ... circuits (IC), or sample preparation equipment + Traditional electronics lab equipment supporting component or module test and debug activities + Reverse engineering embedded hardware and software + Programming and using data acquisition tools + Experience… more
    Battelle Memorial Institute (09/24/25)
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