- BOOZ, ALLEN & HAMILTON, INC. (Wright-Patterson AFB, OH)
- …electrical failure analysis, including thermal CW and transient imaging, X-ray, electroluminescence, and Scanning Electron Microscope ( SEM ) + Knowledge of ... semic ond uctor physics and degradation mechanisms in GaN, SiC, and CMOS devices + Ability to identify and analyze gaps in test methodologies + Possession of excellent verbal and written communication skills, including preparing and delivering technical… more