- Battelle Memorial Institute (Columbus, OH)
- …materials characterization, electrical, and/or structural characterization: focused ion beam (FIB), scanning electron microscopy (SEM), light microscopy ... semiconductor characterization techniques: energy dispersive spectroscopy (EDS), atomic force microscopy (AFM), X-ray computed tomography (XCT) + Familiarity with… more
- Schaeffler (Wooster, OH)
- …to develop competitive products. + Conduct lab characterization of materials ( scanning electron microscopy , dynamic mechanical analysis, thermogravimetric ... analysis, differential scanning calorimetry, Electro-Chemical characterizations, etc.). + Break down battery structures into subsystems and components, create a detailed product specification, and check whether existing subsystems and components can be… more