- Adecco US, Inc. (Santa Clara, CA)
- …of scanning electron microscopy (SEM), focused ion beam (FIB), and transmission electron microscopy ( TEM ). . Perform SEM/FIB system and ... electron microscopy (SEM), focused ion beam (FIB), and transmission electron microscopy ( TEM ). . Education: Technical Diploma Skills… more
- Applied Materials (Santa Clara, CA)
- …of scanning electron microscopy (SEM), focused ion beam (FIB), and transmission electron microscopy ( TEM ). + Perform SEM/FIB system and ... experimentation to evaluate the performance of the process system. + Prepare transmission electron microscope ( TEM ) lamella samples using focused ion beam… more
- Adecco US, Inc. (Santa Clara, CA)
- …. Understand basic scanning electron microscopy (SEM)/Focused Ion Beam (FIB)/ Transmission electron microscopy ( TEM ) principle. . Perform basic ... for experimentation, to help evaluates performance of process system . Prepare transmission electron microscope ( TEM ) lamella samples by focused ion beam… more